TY - JOUR A1 - Becker, T. A1 - Özkul, M. A1 - Stilla, U. T1 - SIMULATION OF CLOSE-RANGE PHOTOGRAMMETRIC SYSTEMS FOR INDUSTRIAL SURFACE INSPECTION JO - Int. Arch. Photogramm. Remote Sens. Spatial Inf. Sci. J1 - ISPRS-Archives VL - XXXVIII-3/W22 SP - 179 EP - 183 Y1 - 2013/04/26 PB - Copernicus Publications SN - 2194-9034 UR - https://isprs-archives.copernicus.org/articles/XXXVIII-3-W22/179/2011/ L1 - https://isprs-archives.copernicus.org/articles/XXXVIII-3-W22/179/2011/isprsarchives-XXXVIII-3-W22-179-2011.pdf DO - 10.5194/isprsarchives-XXXVIII-3-W22-179-2011 ER -